Paper Title:

Automation of Photoacoustic Spectrometer for NDE Applications

Periodical Materials Science Forum (Volume 699)
Main Theme Characterization of Advanced Materials
Edited by R. Saravanan
Pages 185-204
DOI 10.4028/www.scientific.net/MSF.699.185
Citation P. Palanichamy et al., 2011, Materials Science Forum, 699, 185
Online since September, 2011
Authors P. Palanichamy, P. Kalyanasundaram, K. Jeyadheepan, M. Jeyaprakasam, K. Ramachandran, C. Sanjeeviraja
Keywords NDE, Photoacoustics, Thermal Diffusivity, Ultrasonics
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Abstract

New software using VEE Pro was developed to integrate the various components of photoacoustic spectrometer through RS-232 interface and this is the first time such an effort is made not only to integrate but also to automatically acquire the data for depth profile and wave length scanning. The performance and validity was rigorously tested for repeatability and standard error for samples like air, glass and silicon wafer. As an application towards NDE, the thermal parameters obtained from photoacoustics are compared with ultrasonics and discussed.