Automation of Photoacoustic Spectrometer for NDE Applications |
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| Journal | Materials Science Forum (Volume 699) |
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| Volume | Characterization of Advanced Materials |
| Edited by | R. Saravanan |
| Pages | 185-204 |
| DOI | 10.4028/www.scientific.net/MSF.699.185 |
| Citation | P. Palanichamy et al., 2011, Materials Science Forum, 699, 185 |
| Online since | September, 2011 |
| Authors | P. Palanichamy, P. Kalyanasundaram, K. Jeyadheepan, M. Jeyaprakasam, K. Ramachandran, C. Sanjeeviraja |
| Keywords | NDE, Photoacoustics, Thermal Diffusivity, Ultrasonics |
| Abstract | New software using VEE Pro was developed to integrate the various components of photoacoustic spectrometer through RS-232 interface and this is the first time such an effort is made not only to integrate but also to automatically acquire the data for depth profile and wave length scanning. The performance and validity was rigorously tested for repeatability and standard error for samples like air, glass and silicon wafer. As an application towards NDE, the thermal parameters obtained from photoacoustics are compared with ultrasonics and discussed. |
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