Ti-rich Mg1ЎxTi1+xO3 samples were synthesized by solid-state reaction. Sampleswere characterized by room temperature x-ray powder di®raction, scanning electron microscopyand energy dispersive spectroscopy of x-rays. Hexagonal lattice parameters a and c increasedwith increasing Ti content. Time-of-Flight-Secondary-Ion-Mass-Spectroscopy (ToF-SIMS, de-tection limit 10Ў6) measurements revealed that no magnetic impurities were present. Sampleswith x = 0:10; 0:12 and 0:32 showed ferromagnetic hysteresis loops. The result demonstratesthat excess Ti at the Mg-O cation layer controls the magnetic properties. This is a technologicaladvantage especially for thin Їlm applications.