Paper Title:
Textured Multiferroics: 2-D Diffraction and Properties Prediction
  Abstract

A description of recent work performed by collaboration among the CIMAV Crystal Physics Group, the ILL Diffraction Group and the GEC Nanotechnology Education and Research Centre (NERC), regarding structure-electromagnetic properties relationships, is given. Structure analysis puts emphasis on thin films texture characterization. The new software package ANAELU, for texture analysis via two-dimensional (2-D) diffraction detection, is described. Crystallographic texture plays a significant role on ferroic and multiferroic bulk and nano-structured materials properties. With the objective of estimating effective values for polycrystal dielectric, piezoelectric, elastic and magnetoelectric coefficients, the Voigt, Reuss and Hill approximations are systematized in an extended version of program SAMZ.

  Info
Periodical
Materials Science Forum (Volumes 702-703)
Chapter
Chapter 6: Materials
Edited by
Asim Tewari, Satyam Suwas, Dinesh Srivastava, Indradev Samajdar and Arunansu Haldar
Pages
1007-1010
DOI
10.4028/www.scientific.net/MSF.702-703.1007
Citation
A. Muñoz-Romero, L. Fuentes-Montero, M.E. Montero-Cabrera, U. Trivedi, L. E. Fuentes-Cobas, "Textured Multiferroics: 2-D Diffraction and Properties Prediction", Materials Science Forum, Vols. 702-703, pp. 1007-1010, 2012
Online since
December 2011
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Price
$35.00
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