Paper Title:
Microstructural Characterization of Ferroelectric Bismuth Ferrite (BiFeO3) Ceramic by Electron Backscattered Diffraction
  Abstract

Ferroelectric BiFeO3 (BFO) is potential candidate for future generation of FeRAM due to its large polarization. However, BFO is very sensitive to secondary phase formation during synthesis because of volatility issues related to Bismuth. Investigation of the microstructure for phase purity is the key as impurities can destroy the desired properties. We have used backscattered electron diffraction to study the microstructure of BFO ceramic. The EBSD results provide a direct evidence of the appearance of secondary phase that XRD could not be detected in XRD.

  Info
Periodical
Materials Science Forum (Volumes 702-703)
Chapter
Chapter 6: Materials
Edited by
Asim Tewari, Satyam Suwas, Dinesh Srivastava, Indradev Samajdar and Arunansu Haldar
Pages
1011-1014
DOI
10.4028/www.scientific.net/MSF.702-703.1011
Citation
J. Kolte, D. Gulwade, A. Daryapurkar, P. Gopalan, "Microstructural Characterization of Ferroelectric Bismuth Ferrite (BiFeO3) Ceramic by Electron Backscattered Diffraction", Materials Science Forum, Vols. 702-703, pp. 1011-1014, 2012
Online since
December 2011
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Price
$35.00
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