Paper Title:
Dislocation Densities, Slip-System Types and Burgers Vector Populationsinhexagonal and Cubiccrystalsfrom X-Ray Line Profile Analysis
  Abstract

X-ray diffraction line profile analysis can be carried out on the hkl planes corresponding to the same texture component or the same crystallographic orientation fiber. It is shown that in textured polycrystalline materials or in thin films or multilayers X-ray line profiles measured on planes corresponding either to the main or the minor texture components can provide the Burgers vector population and dislocations densities in the different texture components separately. The experimental technique is outlined for textured specimens and the multiple convolutional whole profile method, i.e. the CMWP line profile analysis procedure, is presented for its capacity to determine the substructure pertaining to different texture components in textured samples.

  Info
Periodical
Materials Science Forum (Volumes 702-703)
Chapter
Chapter 4: Technique
Edited by
Asim Tewari, Satyam Suwas, Dinesh Srivastava, Indradev Samajdar and Arunansu Haldar
Pages
479-484
DOI
10.4028/www.scientific.net/MSF.702-703.479
Citation
T. Ungár, "Dislocation Densities, Slip-System Types and Burgers Vector Populationsinhexagonal and Cubiccrystalsfrom X-Ray Line Profile Analysis", Materials Science Forum, Vols. 702-703, pp. 479-484, 2012
Online since
December 2011
Authors
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Jenő Gubicza, Iuliana C. Dragomir, Gábor Ribárik, Yuntian T. Zhu, Ruslan Valiev, Tamás Ungár
229
Authors: Iuliana C. Dragomir, András Borbély, Tamás Ungár
Abstract:Anisotropic strain broadening of diffraction peaks can be parameterised by dislocation contrast factors. A comprehensive ...
95
Authors: Tamás Ungár
Abstract:The fundamentals of X-ray line profile analysis are summarised in terms of subgrain size and size-distribution, dislocation density and...
133
Authors: Tamás Ungár, L. Balogh, Gábor Ribárik
Abstract:High resolution X-ray line profile analysis is sensitive to crystallite size, dislocation densities and character, and to planar defects,...
571
Authors: Luciano Santos Constantin Raptopoulos, Gilberto Alexandre Castello-Branco, Cristiane Maria Basto Bacaltchuk, Iuliana Dragomir-Cernatescu, Hamid Garmestani
Abstract:Titanium alloys are used in a wide variety of aerospace, energy, industrial and biomedical applications, among other reasons, due to their...
99