Abstract In the present work, we summarized two calculation methods to determine some specific crystallographic elements based on electron diffraction orientation measurements performed by TEM. The first one is to determine the type and the Burgers vector of dislocations for a known crystal structure. The method calculates the orientation of the projections of all the possible dislocation line vectors in the TEM screen coordinate system using the determined crystallographic orientation of the grain and then compares them with the observed ones to identify the observed dislocations. The second is to characterize the surface crystalline planes and directions of faceted nano-particles. With the determination of the edge trace vectors and then the plane normal vectors in the screen coordinate system of the TEM, their Miller indices in the crystal coordinate system can be calculated through coordinate transformation. These methods are expected to facilitate the related studies.