Paper Title:
Boundary Migration during Recrystallization of Heavily Deformed Pure Nickel
  Abstract

The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries. During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. The correlation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.

  Info
Periodical
Materials Science Forum (Volumes 715-716)
Chapter
Tuesday
Edited by
E.J. Palmiere and B.P. Wynne
Pages
329-332
DOI
10.4028/www.scientific.net/MSF.715-716.329
Citation
Y. B. Zhang, D. J. Jensen, A. Godfrey, "Boundary Migration during Recrystallization of Heavily Deformed Pure Nickel", Materials Science Forum, Vols 715-716, pp. 329-332, Apr. 2012
Online since
April 2012
Price
US$ 28,-
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