Paper Title:

3D-EBSD Studies of Deformation, Recrystallization and Phase Transformations

Periodical Materials Science Forum (Volumes 715 - 716)
Main Theme Recrystallization and Grain Growth IV
Edited by E.J. Palmiere and B.P. Wynne
Pages 41-50
DOI 10.4028/www.scientific.net/MSF.715-716.41
Citation Michael Ferry et al., 2012, Materials Science Forum, 715-716, 41
Online since April, 2012
Authors Michael Ferry, Wan Qiang Xu, M. Zakaria Quadir, Nasima Afrin Zinnia, Kevin J. Laws, Nora Mateescu, Lalu Robin, Lori Bassman, Julie M. Cairney, John F. Humphreys, Adeline Albou, Julian H. Driver
Keywords 3D-EBSD, Deformation, Focused Ion Beam, Recrystallization, Serial Sectioning
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Abstract

A focused ion beam (FIB) coupled with high resolution electron backscatter diffraction (EBSD) has emerged as a useful tool for generating crystallographic information in reasonably large volumes of microstructure. In principle, data generation is reasonably straightforward whereby the FIB is used as a high precision serial sectioning device for generating consecutive milled surfaces suitable for mapping by EBSD. The successive EBSD maps generated by serial sectioning are combined using various post-processing methods to generate crystallographic volumes of the microstructure. This paper provides an overview of the use of 3D-EBSD in the study of various phenomena associated with thermomechanical processing of both crystalline and semi-crystalline alloys and includes investigations on the crystallographic nature of microbands, void formation at particles, phase redistribution during plastic forming, and nucleation of recrystallization within various regions of the deformation microstructure.