Paper Title:
Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction
  Abstract

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Periodical
Materials Science Forum (Volumes 79-82)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
165-168
DOI
10.4028/www.scientific.net/MSF.79-82.165
Citation
H.-G. Brühl, H. Rhan, "Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction", Materials Science Forum, Vols. 79-82, pp. 165-168, 1991
Online since
January 1991
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Price
$32.00
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