Paper Title:
The Application of a Proportional-Scintillation-Detector in X-Ray Diffractometry
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 79-82)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
399-404
DOI
10.4028/www.scientific.net/MSF.79-82.399
Citation
K. Richter, D. Meyer, J. Linz, K. Moras, W. Blau, "The Application of a Proportional-Scintillation-Detector in X-Ray Diffractometry", Materials Science Forum, Vols. 79-82, pp. 399-404, 1991
Online since
January 1991
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Price
$32.00
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