Paper Title:
Depth Profiling in Thin Films by Grazing Incidence Diffraction using Synchrotron Radiation
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 79-82)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
469-474
DOI
10.4028/www.scientific.net/MSF.79-82.469
Citation
T. Wroblewski, "Depth Profiling in Thin Films by Grazing Incidence Diffraction using Synchrotron Radiation", Materials Science Forum, Vols. 79-82, pp. 469-474, 1991
Online since
January 1991
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.