Paper Title:
Characterization of Epitaxial Thin Films by X-Ray Diffraction
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 79-82)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
493-502
DOI
10.4028/www.scientific.net/MSF.79-82.493
Citation
A. Segmüller, "Characterization of Epitaxial Thin Films by X-Ray Diffraction", Materials Science Forum, Vols. 79-82, pp. 493-502, 1991
Online since
January 1991
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Price
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