Paper Title:
X-Ray Diffraction Line Profiles due to Real Polycrystals
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 79-82)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
73-84
DOI
10.4028/www.scientific.net/MSF.79-82.73
Citation
P. Klimanek, "X-Ray Diffraction Line Profiles due to Real Polycrystals", Materials Science Forum, Vols. 79-82, pp. 73-84, 1991
Online since
January 1991
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Price
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