Paper Title:
Characterization of Gels and Thin Gel Films by X-Ray Diffraction Methods
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 79-82)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
965-970
DOI
10.4028/www.scientific.net/MSF.79-82.965
Citation
T. Gerber, B. Himmel, U. Buttler, H. Bürger, U. Bräutigam, "Characterization of Gels and Thin Gel Films by X-Ray Diffraction Methods", Materials Science Forum, Vols. 79-82, pp. 965-970, 1991
Online since
January 1991
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.