Characterization of Gels and Thin Gel Films by X-Ray Diffraction Methods |
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| Journal | Materials Science Forum (Volumes 79 - 82) |
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| Volume | European Powder Diffraction |
| Edited by | R. Delhez and E.J. Mittemeijer |
| Pages | 965-970 |
| DOI | 10.4028/www.scientific.net/MSF.79-82.965 |
| Citation | Th. Gerber et al., 1991, Materials Science Forum, 79-82, 965 |
| Authors | Th. Gerber, B. Himmel, U. Buttler, H. Bürger, U. Bräutigam |
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