Transmission Electron Microscopy: An Important Technique for the Determination of the Crystal Structure of Modulated High-Tc Superconductors |
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| Journal | Materials Science Forum (Volumes 79 - 82) |
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| Volume | European Powder Diffraction |
| Edited by | R. Delhez and E.J. Mittemeijer |
| Pages | 971-0 |
| DOI | 10.4028/www.scientific.net/MSF.79-82.971 |
| Citation | O. Eibl et al., 1991, Materials Science Forum, 79-82, 971 |
| Authors | O. Eibl, H. Budin, P. Pongratz, P. Skalicky |
| Full Paper | 
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