Paper Title:
Transmission Electron Microscopy: An Important Technique for the Determination of the Crystal Structure of Modulated High-Tc Superconductors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 79-82)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
971-0
DOI
10.4028/www.scientific.net/MSF.79-82.971
Citation
O. Eibl, H. Budin, P. Pongratz, P. Skalicky, "Transmission Electron Microscopy: An Important Technique for the Determination of the Crystal Structure of Modulated High-Tc Superconductors", Materials Science Forum, Vols. 79-82, pp. 971-0, 1991
Online since
January 1991
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Price
$32.00
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