Paper Title:
Low Fluence Implantations in GaAs: A Mossbauer Spectroscopy Investigation of Individual and Overlapping Damage Cascades
  Abstract

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Periodical
Materials Science Forum (Volumes 83-87)
Edited by
Gordon Davies, G.G. DeLeo and M. Stavola
Pages
1003-1008
DOI
10.4028/www.scientific.net/MSF.83-87.1003
Citation
H. Andreasen, J.W. Petersen, G. Weyer, "Low Fluence Implantations in GaAs: A Mossbauer Spectroscopy Investigation of Individual and Overlapping Damage Cascades", Materials Science Forum, Vols. 83-87, pp. 1003-1008, 1992
Online since
January 1992
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