Combination of Deep Level Transient Spectroscopy and Transmutation of Radioactive Impurities
| Periodical | Materials Science Forum (Volumes 83 - 87) |
|---|---|
| Main Theme | Defects in Semiconductors 16 |
| Edited by | Gordon Davies, G.G. DeLeo and M. Stavola |
| Pages | 1097-1102 |
| DOI | 10.4028/www.scientific.net/MSF.83-87.1097 |
| Citation | Gerhard Pensl et al., 1992, Materials Science Forum, 83-87, 1097 |
| Authors | Gerhard Pensl, M. Lang, M. Gebhard, N. Achtziger, M. Uhrmacher |
| Price | US$ 28,- |