Paper Title:
X-Ray Spectroscopy Following Neutron Irradiation of Semiconductor Silicon
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 83-87)
Edited by
Gordon Davies, G.G. DeLeo and M. Stavola
Pages
1159-1164
DOI
10.4028/www.scientific.net/MSF.83-87.1159
Citation
A.J. Filo, A.J. Meyer, C.C. Swanson, J.P. Lavine, "X-Ray Spectroscopy Following Neutron Irradiation of Semiconductor Silicon", Materials Science Forum, Vols. 83-87, pp. 1159-1164, 1992
Online since
January 1992
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Price
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