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Spectroscopy on Transition-Metal Defects in Silicon

Journal Materials Science Forum (Volumes 83 - 87)
Volume Defects in Semiconductors 16
Edited by Gordon Davies, G.G. DeLeo and M. Stavola
Pages 125-136
DOI 10.4028/www.scientific.net/MSF.83-87.125
Citation Mats Kleverman et al., 1992, Materials Science Forum, 83-87, 125
Authors Mats Kleverman, A. Thilderkvist, G. Grossmann, Hermann G. Grimmeiss
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