Paper Title:
Scanning Tunneling Microscopy Studies of Semiconductor Surface Defects
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 83-87)
Edited by
Gordon Davies, G.G. DeLeo and M. Stavola
Pages
1381-1390
DOI
10.4028/www.scientific.net/MSF.83-87.1381
Citation
J.E. Demuth, "Scanning Tunneling Microscopy Studies of Semiconductor Surface Defects", Materials Science Forum, Vols. 83-87, pp. 1381-1390, 1992
Online since
January 1992
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Price
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