Theoretical Interpretation of EPR Measurements on the Iron-Shallow Acceptor Pairs in Silicon |
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| Journal | Materials Science Forum (Volumes 83 - 87) |
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| Volume | Defects in Semiconductors 16 |
| Edited by | Gordon Davies, G.G. DeLeo and M. Stavola |
| Pages | 143-148 |
| DOI | 10.4028/www.scientific.net/MSF.83-87.143 |
| Citation | Lucy V.C. Assali et al., 1992, Materials Science Forum, 83-87, 143 |
| Authors | Lucy V.C. Assali, J.R. Leite |
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