Paper Title:
Deep States Associated with Copper Decorated Oxidation Induced Stacking Faults in Silicon
  Abstract

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Periodical
Materials Science Forum (Volumes 83-87)
Edited by
Gordon Davies, G.G. DeLeo and M. Stavola
Pages
1457-1462
DOI
10.4028/www.scientific.net/MSF.83-87.1457
Citation
M. Kaniewska, J. Kaniewski, A. R. Peaker, "Deep States Associated with Copper Decorated Oxidation Induced Stacking Faults in Silicon", Materials Science Forum, Vols. 83-87, pp. 1457-1462, 1992
Online since
January 1992
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Price
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