Annealing of Damage in GaAs and InP after Implantation of Cd and In |
| Journal |
Materials Science Forum (Volumes 83 - 87) |
| Volume |
Defects in Semiconductors 16 |
| Edited by |
Gordon Davies, G.G. DeLeo and M. Stavola |
| Pages |
1481-1486 |
| DOI |
10.4028/www.scientific.net/MSF.83-87.1481 |
| Citation |
Wulf Pfeiffer et al., 1992, Materials Science Forum, 83-87, 1481 |
| Authors |
Wulf Pfeiffer, Manfred Deicher, R. Kalish, R. Keller, R. Magerle, N. Moriya, P. Pross, H. Skudlik, Th. Wichert, Herbert Wolf |
| Full Paper |
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