Paper Title:
The Properties of Individual Si/SiO2 Defects and Their Link to 1/F Noise
  Abstract

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Periodical
Materials Science Forum (Volumes 83-87)
Edited by
Gordon Davies, G.G. DeLeo and M. Stavola
Pages
1519-1530
DOI
10.4028/www.scientific.net/MSF.83-87.1519
Citation
M. J. Uren, "The Properties of Individual Si/SiO2 Defects and Their Link to 1/F Noise", Materials Science Forum, Vols. 83-87, pp. 1519-1530, 1992
Online since
January 1992
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Price
$32.00
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