The Study of Interfacial Traps of InP Metal-Insulator-Semiconductor Stuctures |
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| Journal | Materials Science Forum (Volumes 83 - 87) |
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| Volume | Defects in Semiconductors 16 |
| Edited by | Gordon Davies, G.G. DeLeo and M. Stavola |
| Pages | 1569-0 |
| DOI | 10.4028/www.scientific.net/MSF.83-87.1569 |
| Citation | L. Lu et al., 1992, Materials Science Forum, 83-87, 1569 |
| Authors | L. Lu, J. Zhou, W. Qu, S. Zhang |
| Full Paper | 
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