New Traps for H0 in Boron- and Phosphorus-Doped Si |
|
| Journal | Materials Science Forum (Volumes 83 - 87) |
|---|---|
| Volume | Defects in Semiconductors 16 |
| Edited by | Gordon Davies, G.G. DeLeo and M. Stavola |
| Pages | 27-32 |
| DOI | 10.4028/www.scientific.net/MSF.83-87.27 |
| Citation | Levente Korpas et al., 1992, Materials Science Forum, 83-87, 27 |
| Authors | Levente Korpas, James W. Corbett, Stefan Estreicher |
| Full Paper | 
Get the full paper by clicking here
|
First page example
