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Effect of Multiple Trapping on Hydrogen Diffusion in Silicon

Journal Materials Science Forum (Volumes 83 - 87)
Volume Defects in Semiconductors 16
Edited by Gordon Davies, G.G. DeLeo and M. Stavola
Pages 51-56
DOI 10.4028/www.scientific.net/MSF.83-87.51
Citation Jeffrey T. Borenstein et al., 1992, Materials Science Forum, 83-87, 51
Authors Jeffrey T. Borenstein, James W. Corbett, S.J. Pearton
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