Paper Title:
Correlation Effects due to Ionized Defects in Semiconductors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 83-87)
Edited by
Gordon Davies, G.G. DeLeo and M. Stavola
Pages
805-816
DOI
10.4028/www.scientific.net/MSF.83-87.805
Citation
Z. Wilamowski, W. Jantsch, G. Ostermayer, J. Kossut, "Correlation Effects due to Ionized Defects in Semiconductors", Materials Science Forum, Vols. 83-87, pp. 805-816, 1992
Online since
January 1992
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Price
$32.00
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