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Interaction of Deuterium with Internal Surfaces in Silicon

Journal Materials Science Forum (Volumes 83 - 87)
Volume Defects in Semiconductors 16
Edited by Gordon Davies, G.G. DeLeo and M. Stavola
Pages 81-86
DOI 10.4028/www.scientific.net/MSF.83-87.81
Citation S.M. Myers et al., 1992, Materials Science Forum, 83-87, 81
Authors S.M. Myers, D.M. Follstaedt, H.J. Stein, W.R. Wampler
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