Paper Title:
Synchrotron White Beam X-Ray Topographic In Situ Study of the Different Types of Grain Growth
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 94-96)
Edited by
G. Abbruzzese and P. Brozzo
Pages
17-26
DOI
10.4028/www.scientific.net/MSF.94-96.17
Citation
J. Gastaldi, C. Jourdan, G. Grange, "Synchrotron White Beam X-Ray Topographic In Situ Study of the Different Types of Grain Growth ", Materials Science Forum, Vols. 94-96, pp. 17-26, 1992
Online since
January 1992
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Price
$32.00
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