Papers by keyword «Oxidation» and «Stacking Fault»
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Characterization of Double Stacking Faults Induced by Thermal Processing of Heavily N-Doped 4H-SiC Substrates
Authors: B.J. Skromme, M.K. Mikhov, L. Chen, G. Samson, Rong Jun Wang, Can Hua Li, I. Bhat
Keywords: Electrostatic Force Microscopy, Heavy Doping, Oxidation, Photoluminescence (PL), Polytype Transformation, Raman Scattering, Secondary Electron Imaging, Stacking Fault
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Defect Injection and Diffusion in Semiconductors
Authors: Nicolaas Stolwijk, H. Bracht, H.-G. Hettwer, Wilfried Lerch, Helmut Mehrer, A. Rucki, W. Jäger
Keywords: Dislocation, Gallium Arsenide, Kick-Out Mechanism, Nitridation, Oxidation, Precipitation, Self-Interstitials, Silicidation, Silicon, Stacking Fault, Vacancy, Voids
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