Papers by keyword «Raman Spectroscopy»
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Growth Control and Properties of Si Nanograins Embedded in either Amorphous Silicon or SiO2 Matrix
Authors: Richard Rizk
Keywords: Infrared Spectroscopy, Nanocrystallization, Nanoscale Size Effects, Photoluminescence (PL), Raman Spectroscopy, Si Nanograins, Si/SiO2, Tunneling Conductivity
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Contactless Measurement of the Thermal Conductivity of Thin SiC Layers
Authors: S. Rohmfeld, Martin Hundhausen, Lothar Ley
Keywords: Annealing, Chemical Vapor Deposition (CVD), Laser, Raman Spectroscopy, Thermal Conductivity
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Cross-Sectional Micro-Raman Spectroscopy: A Tool for Structural Investigations of Thin Polytypic SiC Layers
Authors: T. Werninghaus, D.R.T. Zahn, R.A. Yankov, A. Mücklich, Jörg Pezoldt
Keywords: Epitaxy, Ion Implantation, Phase Transformation, Polytypism, Raman Spectroscopy, Transmission Electron Microscopy (TEM)
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Raman Determination of Stresses and Strains in 3C-SiC Films Grown on 6-Inch Si Substrates
Authors: C. Hagiwara, Kohei M. Itoh, J. Muto, Hiroyuki Nagasawa, Kuniaki Yagi, Hiroshi Harima, K. Mizoguchi, Shinichi Nakashima
Keywords: 3C-SiC/Si, Raman Spectroscopy, Strains, Stresses
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Stress Measurements in sub-μm Si Structures Using Raman Spectroscopy
Authors: K.F. Dombrowski, I. De Wolf
Keywords: Mechanical Stress, Raman Spectroscopy, Silicon
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Optical Properties of Crystalline Gels of Barium Titanate System
Authors: Hirofumi Matsuda, Takayuki Kobayashi, H. Shiibashi, Makoto Kuwabara
Keywords: Local Crystalline Symmetry, Raman Spectroscopy, Second-Harmonic Generation, Size Effect, Sol-Gel-Derived Fine Crystalline BaTiO3, X-Ray Diffraction (XRD)
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Mechanism of Various Defects Formation in Epitaxial Layer Prepared by Sublimation Epitaxy
Authors: Tomoaki Furusho, K. Matsumoto, Hiroshi Harima, Shigehiro Nishino
Keywords: Micropipe, Raman Spectroscopy, Small Angle Grain Boundaries, Sublimation Epitaxy, Sublimation Method, X-Ray Diffractometry
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Plasma Enhanced Chemical Vapor Deposition and Characterization of Hydrogenated Amorphous SiC Films on Si
Authors: Yi Hua Wang, Jian Yi Lin, Zhe Chuan Feng, Soo Jin Chua, Cheng Hon Huan Alfred
Keywords: Amorphous Silicon Carbide, PECDV, Photoluminescence (PL), Raman Spectroscopy
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Isotope Effects on the Raman Spectrum of SiC
Authors: S. Rohmfeld, Martin Hundhausen, Lothar Ley, Norbert Schulze, Gerhard Pensl
Keywords: 13C Isotope, Modified Lely, Phonon Dispersion, Raman Spectroscopy
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Disappearance of the LO-Phonon Line in the UV-Raman Spectrum of 6H-SiC
Authors: Roland Püsche, S. Rohmfeld, Martin Hundhausen, Lothar Ley
Keywords: Folded Phonon Modes, Raman Polarizability, Raman Spectroscopy
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