HOME CONTACT

Username: Password:

> @scientific.net

Reactive UHV Sputtering and Structural Characterization of Epitaxial AlN and 6H-SiC(0001) Thin Films

Papers by keyword «Reactive UHV Sputtering and Structural Characterization of Epitaxial AlN» and «6H-SiC(0001) Thin Films»	Next 10 Keywords Compounds, Intercalation (0 entries) Materials, Acousto-Optic (0 entries) Materials, Advanced Technology (0 entries) Materials, Amorphous (0 entries) Materials, Electronic (0 entries) Materials, Heterogenous (0 entries) Materials, Magnetic (0 entries) Materials, Polycrystalline (0 entries) Materials, Reactor (0 entries) Metals and Alloys (0 entries)
Total: 0 pages; 0 papers