Papers by keyword «Residual Stress» and «Thin Film»
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Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction
Authors: K. Fischer, H. Oettel
Keywords: Arc Evaporation, Electrical Contacts, Hard Coating, Magnetron-Sputtering, Residual Stress, SEEMANN-BOHLIN-Focusing, Thin Film, Titanium Nitride, X-Ray Diffraction (XRD)
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An Analysis of the Influence of Crystallographic Texture on Residual Stress Estimation for Metallic Films and Coatings
Authors: I. Iordanova, D. Neov, K.S. Forcey, H. Heitzek, R. Bezdushnyi
Keywords: Residual Stress, Sprayed Coatings, Texture, Thin Film
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Residual Stress in Diamond Coatings by Synchrotron Radiation XRD
Authors: Paolo Scardi, Matteo Leoni, V. Sessa, M.L. Terranova, G. Cappuccio
Keywords: Diamond, Hot Filament Chemical Vapor Deposition (HFCVD), Residual Stress, Synchrotron Radiation, Thin Film, X-Ray Diffraction (XRD)
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Residual Stresses in Polycrystalline Thin Films
Authors: Paolo Scardi, Yu Hui Dong
Keywords: Residual Stress, Stress Gradients, Texture, Thin Film, X-Ray Elastic Constants
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Strain-Texture Correlation in r.f. Magnetron Sputtered Thin Films
Authors: Matteo Leoni, Yu Hui Dong, Paolo Scardi
Keywords: PVD, Residual Stress, Texture, Thin Film, Zirconia
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Fabrication, Microstructure and Stress Effects in Sputtered TiNi Thin Films
Authors: D.S. Grummon
Keywords: Actuator, MEMS, Residual Stress, Shape Memory, Sputtering, Thin Film, TiNi
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Macro Stress Mapping on Thin Film Buckling
Authors: Philippe Goudeau, Pascale Villain, Pierre Olivier Renault, Nobumichi Tamura, R.S. Celestre, H.A. Padmore
Keywords: Delamination, Micro X-Ray Diffraction, Residual Stress, Strain Mapping, Thin Film
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Novel Methods to Measure Residual Stresses in Thin Films
Authors: Tong Yi Zhang
Keywords: Indentation Fracture Tests, Microbridge Tests, Micro-Rotating-Structures, Residual Stress, Thin Film
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Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction
Authors: Luca Lutterotti, Siegfried Matthies, Daniel Chateigner, Sandro Ferrari, Jesús Ricote
Keywords: Diffraction, Residual Stress, Rietveld, Texture, Thin Film
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Elastic Properties of Supported Polycrystalline Thin Films and Multilayers: an X-Ray Diffraction Study
Authors: Philippe Goudeau, Pascale Villain, Nobumichi Tamura, Pierre Olivier Renault, K.F. Badawi, H.A. Padmore
Keywords: Elastic Constants, Microstructure, Multilayers, Residual Stress, Thin Film, X-Ray Diffraction (XRD)
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