Paper Title:
Characterization of Ion-Implanted Heavily-Doped Silicon by Optical Reflection
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 1-2)
Edited by
D. Stievenard and J.C. Bourgoin
Pages
1-9
DOI
10.4028/www.scientific.net/SSP.1-2.1
Citation
A. Borghesi, G. Guizzetti, L. Nosenzo, "Characterization of Ion-Implanted Heavily-Doped Silicon by Optical Reflection", Solid State Phenomena, Vols. 1-2, pp. 1-9, 1988
Online since
January 1991
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.