Paper Title:
Electrical Characterization of Buried Layers in Silicon
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 1-2)
Edited by
D. Stievenard and J.C. Bourgoin
Pages
85-114
DOI
10.4028/www.scientific.net/SSP.1-2.85
Citation
W. R. Fahrner, E. Klausmann, "Electrical Characterization of Buried Layers in Silicon", Solid State Phenomena, Vols. 1-2, pp. 85-114, 1988
Online since
January 1991
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Price
$35.00
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