Paper Title:
Microstructure and Texture of Shear Bands in Cold Rolled Silicon Steel Single Crystals of Goss Orientation
  Abstract

An initially Goss-oriented ({110}<001> preferred crystal orientation) FeSi single crystal was cold rolled up to 89 % reduction in thickness. The microstructure and texture of shear bands, which develop at strains higher than 70 %, were investigated by the EBSD (electron backscatter diffraction) technique. The texture components within and ouside of the shear bands are the two symmetrical {111}<112> orientations and the {110}<001> orientation. We conclude that crystallographic slip is the deformation mechanism that is active both within and outside of the shear bands.

  Info
Periodical
Solid State Phenomena (Volume 105)
Edited by
C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner
Pages
239-244
DOI
10.4028/www.scientific.net/SSP.105.239
Citation
D. Dorner, S. Zaefferer, "Microstructure and Texture of Shear Bands in Cold Rolled Silicon Steel Single Crystals of Goss Orientation ", Solid State Phenomena, Vol. 105, pp. 239-244, 2005
Online since
July 2005
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