Paper Title:
Texture and Microstructure Imaging by the Moving Area Detector Method
  Abstract

Additional to the position of any volume element of a (poly)-crystalline material its crystal orientation must also be known. Both together are described in the six-dimensional orientation-location space. The paper describes the most frequent structures of materials in this space and how these can be imaged with the "Moving Area Detector Method" using hard synchrotron X-rays. This technique is equally well suited for basic reseach in materials science as well as for non-destructive testing of technological parts or even complex structural components.

  Info
Periodical
Solid State Phenomena (Volume 105)
Edited by
C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner
Pages
3-14
DOI
10.4028/www.scientific.net/SSP.105.3
Citation
A. Preusser, H. Klein, H. J. Bunge, "Texture and Microstructure Imaging by the Moving Area Detector Method", Solid State Phenomena, Vol. 105, pp. 3-14, 2005
Online since
July 2005
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Dorothée Dorner, Ludger Lahn, Stefan Zaefferer
Abstract:A silicon steel single crystal with {110}<001> Goss orientation was cold rolled up to 89 % thickness reduction and subsequently annealed. The...
129
Authors: Yun Lai Deng, Xin Ming Zhang, Xun Liang, Yong Zhang
929
Authors: Patricia Gobernado, Roumen H. Petrov, Jaap Moerman, Carla Barbatti, Leo Kestens
Chapter 6: Materials
Abstract:The recrystallization texture of highly cold deformed IF steels is addressed. The latter is characterized by the //ND fibre and a certain...
790
Authors: Magdalena Bieda
Abstract:New subdivision of microscopic investigation called Orientation Microscopy (OM) is already well known in scanning electron microscope (SEM)....
53