Texture and Microstructure Imaging by the Moving Area Detector Method |
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| Journal | Solid State Phenomena (Volume 105) |
|---|---|
| Volume | Texture and Anisotropy of Polycrystals II |
| Edited by | C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner |
| Pages | 3-14 |
| DOI | 10.4028/www.scientific.net/SSP.105.3 |
| Citation | Andrea Preusser et al., 2005, Solid State Phenomena, 105, 3 |
| Online since | July, 2005 |
| Authors | Andrea Preusser, Helmut Klein, Hans Joachim Bunge |
| Keywords | Diffraction Imaging Technique, Moving Area Detector Technique, Multipeak Textures, Nickel Ni, Recrystallization, Shortwave Synchrotron Radiation, Six-Dimensional Orientation-Location Space |
| Abstract | Additional to the position of any volume element of a (poly)-crystalline material its crystal orientation must also be known. Both together are described in the six-dimensional orientation-location space. The paper describes the most frequent structures of materials in this space and how these can be imaged with the "Moving Area Detector Method" using hard synchrotron X-rays. This technique is equally well suited for basic reseach in materials science as well as for non-destructive testing of technological parts or even complex structural components. |
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