Paper Title:
Texture Gradient in ECAP Copper Measured by Synchrotron Radiation
  Abstract

Copper of 4N purity was deformed at room temperature by equal channel angular pressing (ECAP) using three passes of route A. The local microstructure and texture were investigated by orientation imaging microscopy and high-energy synchrotron radiation, respectively. The microstructure consists of elongated grains which are inclined to the extrusion direction. The texture is characterized by typical shear components of fcc metals which deviate from their ideal positions. The inclination of the grain long axis and the texture components with respect to the extrusion direction depends on the distance from the top of the extruded bar and changes from pass to pass. Reasons for the texture gradient are discussed.

  Info
Periodical
Solid State Phenomena (Volume 105)
Edited by
C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner
Pages
327-332
DOI
10.4028/www.scientific.net/SSP.105.327
Citation
W. Skrotzki, N. Scheerbaum, C.G. Oertel, H. G. Brokmeier, S. Suwas, L. S. Tóth, "Texture Gradient in ECAP Copper Measured by Synchrotron Radiation", Solid State Phenomena, Vol. 105, pp. 327-332, 2005
Online since
July 2005
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