The paper is an account of TEM based automatic orientation mapping summarizing more than two years of using the system. Following a brief introduction of the system elements, some representative applications are described. We focus on the characterization of fine-grain materials, mapping of low symmetry materials (metastable chromium carbide) and semi-automatic analysis of misorientations in a fully lamellar polycrystalline (g+a2) TiAl alloy. Moreover, the current state of the TEM based system is discussed and compared to EBSD systems. In particular, the issues of spatial resolution, accuracy, map acquisition time, reliability are considered.