Paper Title:
Texture Analysis with Area Detectors
  Abstract

Starting from simple geometric considerations concerning directions and orientations, intelligent strategies for pole figure measurements were developed for the area detector. The amount and quality of texture information contained in measured or available data sets can be directly controlled. The texture approximation is done by the component method. The method does not have any restrictions concerning the grids of sample directions in the pole figures. An almost constant information depth can be obtained at a low angle of incidence of the primary beam for the study of thin surface layers.

  Info
Periodical
Solid State Phenomena (Volume 105)
Edited by
C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner
Pages
71-76
DOI
10.4028/www.scientific.net/SSP.105.71
Citation
K. Helming, U. Preckwinkel, "Texture Analysis with Area Detectors", Solid State Phenomena, Vol. 105, pp. 71-76, 2005
Online since
July 2005
Export
Price
$32.00
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