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Texture Analysis with Area Detectors

Journal Solid State Phenomena (Volume 105)
Volume Texture and Anisotropy of Polycrystals II
Edited by C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner
Pages 71-76
DOI 10.4028/www.scientific.net/SSP.105.71
Citation Kurt Helming et al., 2005, Solid State Phenomena, 105, 71
Online since July, 2005
Authors Kurt Helming, Uwe Preckwinkel
Keywords Area Detector, GADDS, ODF-Methods, Texture, Texture Components, Texture Modeling, X-Ray Diffraction (XRD)
Abstract

Starting from simple geometric considerations concerning directions and orientations, intelligent strategies for pole figure measurements were developed for the area detector. The amount and quality of texture information contained in measured or available data sets can be directly controlled. The texture approximation is done by the component method. The method does not have any restrictions concerning the grids of sample directions in the pole figures. An almost constant information depth can be obtained at a low angle of incidence of the primary beam for the study of thin surface layers.

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