Gettering and Defect Engineering in Semiconductor Technology XI
Solid State Phenomena Volumes 108 - 109
doi:10.4028/www.scientific.net/SSP.108-109
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p4
Committees
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33 K
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p5
Preface
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23 K
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p1
Intrinsic Point Defects in Silicon: a Unified View from Crystal Growth, Wafer Processing and Metal Diffusion
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222 K
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Authors: Vladimir V. Voronkov, Robert J. Falster
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p11
Precipitation Enhancement of "so Called" Defect-Free Czochralski Silicon Material
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590 K
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Authors: Timo Müller, G. Kissinger, P. Krottenthaler, C. Seuring, R. Wahlich, Wilfried von Ammon
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p17
Oxygen Precipitation in Nitrogen Doped CZ Silicon
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400 K
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Authors: G. Kissinger, Timo Müller, Andreas Sattler, W. Häckl, M. Weber, U. Lambert, A. Huber, P. Krottenthaler, Hans Richter, Wilfried von Ammon
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p25
From Continuous to Quantized Charging Phenomena in Few Nanocrystals MOS Structures
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450 K
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Authors: G. Benassayag, M. Shalchian, Jeremie Grisolia, C. Bonafos, S.M. Atarodi, A. Claverie
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p33
Passivation of Ge Nanocrystals in SiO2
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233 K
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Authors: Jesper Skov Jensen, Tom P. Leervad Pedersen, Rui Pereira, Pia Bomholt, Jacques Chevallier, Ole Hansen, Arne Nylandsted Larsen, Brian Bech Nielsen
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p39
The Properties of Hydrostatically Strained Ge and Si Nanocrystals in Silicon Dioxide Matrix
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1 M
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Authors: I.E. Tyschenko, A.B. Talochkin, E.N. Vandyshev, A.G. Cherkov, Andrzej Misiuk
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p45
Use of the Nitride to Reduce High-K Secondary Effects in Submicron MOSFETs
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228 K
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Authors: Y. Amhouche, K. Rais
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p53
Laser Assisted Formation on Nanocrystals in Plasma-Chemical Deposited SiNx Films
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276 K
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Authors: Sofia A. Arzhannikova, M.D. Efremov, V.A. Volodin, G.N. Kamaev, D.V. Marin, S.A. Soldatenkov, V.S. Shevchuk, S.A. Kochubei, A.A. Popov, Yu. A. Minakov
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p59
Stability of Emission Properties of Silicon Nanostructures
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194 K
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Authors: M. Baran, L. Khomenkova, N. Korsunska, T. Stara, Moissei K. Sheinkman, V. Yukhymchuk, V. Khomenkov, Y. Goldstein, J. Jedrzejewski, E. Savir
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p65
Blue Photoluminescence from Quantum Size Silicon Nanopowder
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296 K
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Authors: M.D. Efremov, V.A. Volodin, D.V. Marin, Sofia A. Arzhannikova, M.G. Ivanov, S.V. Gorajnov, A.I. Korchagin, V.V. Cherepkov, A.V. Lavrukhin, S.N. Fadeev, R.A. Salimov, S.P. Bardakhanov
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p71
Evolution of Quantum Electronic Features with the Size of Silicon Nanoparticles Embedded in a SiO2 Layer Obtained by Low Energy Ion Implantation
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414 K
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Authors: Jeremie Grisolia, M. Shalchian, G. Benassayag, H. Coffin, C. Bonafos, C. Dumas, S.M. Atarodi, A. Claverie
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p77
Carrier Accumulation in Silicon-On-Insulator Structures Containing Ge Nanocrystals in the Burried SiO2
Layer
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339 K
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Authors: I.E. Tyschenko, A.A. Frantsuzov, O.V. Naumova, B.I. Fomin, D.V. Nikolaev, V.P. Popov
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p83
Ge Nanoclusters in GeO2: Synthesis and Optical Properties
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1 M
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Authors: V.A. Volodin, E.B. Gorokhov, D.V. Marin, A.G. Cherkov, Anton K. Gutakovskii, M.D. Efremov