Gettering and Defect Engineering in Semiconductor Technology XI
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Authors: Vladimir V. Voronkov, Robert J. Falster |
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Precipitation Enhancement of "so Called" Defect-Free Czochralski Silicon Material Authors: Timo Müller, G. Kissinger, P. Krottenthaler, C. Seuring, R. Wahlich, Wilfried von Ammon |
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Oxygen Precipitation in Nitrogen Doped CZ Silicon Authors: G. Kissinger, Timo Müller, Andreas Sattler, W. Häckl, M. Weber, U. Lambert, A. Huber, P. Krottenthaler, Hans Richter, Wilfried von Ammon |
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From Continuous to Quantized Charging Phenomena in Few Nanocrystals MOS Structures Authors: G. Benassayag, M. Shalchian, Jeremie Grisolia, C. Bonafos, S.M. Atarodi, A. Claverie |
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Passivation of Ge Nanocrystals in SiO2 Authors: Jesper Skov Jensen, Tom P. Leervad Pedersen, Rui Pereira, Pia Bomholt, Jacques Chevallier, Ole Hansen, Arne Nylandsted Larsen, Brian Bech Nielsen |
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The Properties of Hydrostatically Strained Ge and Si Nanocrystals in Silicon Dioxide Matrix Authors: Ida E. Tyschenko, A.B. Talochkin, E.N. Vandyshev, A.G. Cherkov, Andrzej Misiuk |
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Use of the Nitride to Reduce High-K Secondary Effects in Submicron MOSFETs Authors: Y. Amhouche, K. Rais |
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Laser Assisted Formation on Nanocrystals in Plasma-Chemical Deposited SiNx Films Authors: Sofia A. Arzhannikova, M.D. Efremov, Vladimir A. Volodin, G.N. Kamaev, D.V. Marin, S.A. Soldatenkov, V.S. Shevchuk, S.A. Kochubei, A.A. Popov, Yu. A. Minakov |
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