Paper Title:
Radiation Induced Transformation of Impurity Centers in the Gate Oxide of Short-Channel SOI MOSFETS
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 108-109)
Edited by
B. Pichaud, A. Claverie, D. Alquier, H. Richter and M. Kittler
Pages
469-476
DOI
10.4028/www.scientific.net/SSP.108-109.469
Citation
A.A. Evtukh, A. Kizjak, V.G. Litovchenko, C. Claeys, E. Simoen, "Radiation Induced Transformation of Impurity Centers in the Gate Oxide of Short-Channel SOI MOSFETS ", Solid State Phenomena, Vols. 108-109, pp. 469-476, 2005
Online since
December 2005
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Price
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