Paper Title:
EBIC and DLTS Study of Deformation Induced Defect Thermal Stability in n-Si
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 108-109)
Edited by
B. Pichaud, A. Claverie, D. Alquier, H. Richter and M. Kittler
Pages
567-570
DOI
10.4028/www.scientific.net/SSP.108-109.567
Citation
O. V. Feklisova, E. B. Yakimov, "EBIC and DLTS Study of Deformation Induced Defect Thermal Stability in n-Si", Solid State Phenomena, Vols. 108-109, pp. 567-570, 2005
Online since
December 2005
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Price
$32.00
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