Paper Title:
Extrinsic Resonance Effects in a Subresonant Mechanical Spectrometer
  Abstract

Extrinsic resonance effects observed in a low-frequency subresonant mechanical spectrometer are reported. High resolution of the mechanical spectrometer enables precise measurement of small values of the mechanical loss tangent ( tanϕ = 1- 2 × 10-4) and the apparent high values of the loss tangent detected for extrinsic resonance effects in the vicinity of the eigen frequencies of the spectrometer. Forced oscillations can be used as a ‘signal quality test’ to validate the quality of exponentially damped harmonic oscillations in the resonant mode.

  Info
Periodical
Solid State Phenomena (Volume 115)
Edited by
B.M. Darinskii and L.B. Magalas
Pages
293-298
DOI
10.4028/www.scientific.net/SSP.115.293
Citation
L. B. Magalas, "Extrinsic Resonance Effects in a Subresonant Mechanical Spectrometer", Solid State Phenomena, Vol. 115, pp. 293-298, 2006
Online since
August 2006
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$32.00
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