Paper Title:
Analysis of Modes in the Nanowire Cavity by FDTD Simulation
  Abstract

The mode frequency and the quality factor of nanowire cavities are calculated from the intensity spectrum obtained by the finite-difference time-domain (FDTD) technique and the Padé approximation. In the free-standing nanowire cavity with the dielectric constant 6.0 and the length of 5 μm, the quality factors of 130, 159, and 151 are obtained for HE11 with frequency around 798 THz, at the cavity radius of 60nm, 75nm, and 90nm, respectively. The Q-factor of 78 is also calculated in the nanowire with length of 5 μm and radius of 60nm grown on the sapphire substrate with refractive index 1.8. The obtained mode field distribution of the fundamental transverse mode shows that the mode field confined very well by the nanowire cavity even when the radius of nanowire is much smaller than the mode wavelength.

  Info
Periodical
Solid State Phenomena (Volumes 121-123)
Edited by
Chunli BAI, Sishen XIE, Xing ZHU
Pages
1125-1128
DOI
10.4028/www.scientific.net/SSP.121-123.1125
Citation
M. Q. Wang, Z. P. Cai, Y. Z. Huang, Q. Chen, X. S. Luo, "Analysis of Modes in the Nanowire Cavity by FDTD Simulation", Solid State Phenomena, Vols. 121-123, pp. 1125-1128, 2007
Online since
March 2007
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Chang Jun Zhu, Jun Fang He, Xue Jun Zhai, Bing Xue, Chong Hui Zhang
Abstract:Two synchronized operating modes of femtosecond and picosecond pulses, cross mode-locking and multi-pulse operating, are presented in a...
284
Authors: Xiao Xiao Li, Bin Zhao Cao
Chapter 2: Opto-Electronics Engineering
Abstract:Complicated microwave cavity loaded with ceramics is first investigated by mode matching method in rubidium frequency standard. In order to...
137
Authors: Jia Hong Zhang, Min Yang, Qing Quan Liu, Fang Gu, Min Li, Yi Xian Ge
Chapter 3: Measurements, Sensors and MEMS
Abstract:This paper presents a novel and effective characterization method for giant piezoresistive properties of silicon nanowires by using the...
881