Paper Title:
The Atomic Force Microscopy (AFM) Charecterization of Ni(phen) 2+3 Fixing Effects on DNA Molecules
  Abstract

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Periodical
Solid State Phenomena (Volumes 121-123)
Edited by
Chunli BAI, Sishen XIE, Xing ZHU
Pages
1359-1362
DOI
10.4028/www.scientific.net/SSP.121-123.1359
Citation
H. Wang, Y. Z. Wu, Z. J. Song, G. C. Zeng, X. Y. Le, J. Y. Cai, "The Atomic Force Microscopy (AFM) Charecterization of Ni(phen) 2+3 Fixing Effects on DNA Molecules", Solid State Phenomena, Vols. 121-123, pp. 1359-1362, 2007
Online since
March 2007
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$32.00
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