Paper Title:
AF/PSTM and Its Application in Nanometer Material Measurement
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 121-123)
Edited by
Chunli BAI, Sishen XIE, Xing ZHU
Pages
859-862
DOI
10.4028/www.scientific.net/SSP.121-123.859
Citation
Y. L. Li, J. Zhang, S. F. Wu, P. F. Li, S. Pan, "AF/PSTM and Its Application in Nanometer Material Measurement", Solid State Phenomena, Vols. 121-123, pp. 859-862, 2007
Online since
March 2007
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