Paper Title:
X-Ray Anomalous Scattering Studies of Fe-Tb Amorphous Thin Films
  Abstract

In order to investigate the atomic structure of sputtered-deposited Fe76Tb24 amorphous film, we performed X-ray anomalous scattering (XAS) measurements at two energies near the Tb K-absorption edge using the synchrotron-radiations (SR). The total, Tb and Fe environmental pair distribution functions (PDF's) of the amorphous film were obtained from the normalized scattering intensities after the corrections for the structural analysis. The coordination numbers were calculated from the area under the fitted PDF profiles multiplied by 4πr 2 and near-neighbor distances were estimated from the positions of the peaks of the fitted profiles.

  Info
Periodical
Solid State Phenomena (Volumes 124-126)
Edited by
Byung Tae Ahn, Hyeongtag Jeon, Bo Young Hur, Kibae Kim and Jong Wan Park
Pages
1653-1656
DOI
10.4028/www.scientific.net/SSP.124-126.1653
Citation
C. W. Kim, Y. Watanabe, S. Nanao, "X-Ray Anomalous Scattering Studies of Fe-Tb Amorphous Thin Films", Solid State Phenomena, Vols. 124-126, pp. 1653-1656, 2007
Online since
June 2007
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Price
$32.00
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