Dependency of Electrical Characteristics on Au Nano-Crystal Size for Non-Volatile Memory Fabricated with Au Nano-Crystal Embedded in PVK(Poly(N-Vinylcarbazole)) Layer |
| Journal |
Solid State Phenomena (Volumes 124 - 126) |
| Volume |
Advances in Nanomaterials and Processing |
| Edited by |
Byung Tae Ahn, Hyeongtag Jeon, Bo Young Hur, Kibae Kim and Jong Wan Park |
| Pages |
33-36 |
| DOI |
10.4028/www.scientific.net/SSP.124-126.33 |
| Online since |
June, 2007 |
| Authors |
Chang Kyu Lee,
Jong Sung Kwon,
In Chul Na,
Byung Il Han,
Young Min Kim,
Jea Gun Park
|
| Keywords |
Au Nano Crystal, Bistability, Curing, Nonvolatile Memory, PBD, PVK |
| Abstract |
We demonstrated a nonvolatile memory fabricated with the sandwich device structure of
Al/Au nano-crystals embedded in the PVK/Al. The bi-stable conduction switching characteristic
(Ion/Ioff ratio) was >1x102, depending on Au nano-crystal size. The size and distribution of Au
nano-crystals were determined by the inserted Au-layer thickness between PVK layers. The size of
Au nano-crystals increased with the inserted Au-layer thickness. The uniform distribution of isolated
Au nano-crystals was obtained with 5 nm of the inserted Au-layer thickness. |
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